Pego Electronics (Yi Chun) Company Limited
Pego Electronics-Focus on developing and promoting IEC lab testing equipments
Add to Cart
IP Testing Equipment Test Probe B for IP2X Testing Jointed Test finger
Introduction:
Design according to IEC61032 figure 2, meet the requirements of UL507, UL1278 figure 8 and EN60529 figure 2. This probe is intended to verify the basic protection against access to hazardous parts. It is used to verify the protection against access with finger.
Specification:
| Diameter of dactylogryposis: | 12mm | Length of dactylogryposis: | 80mm | |
| Diameter of baffle: | 50mm | Length of baffle: | 100mm | |
| Material: Insulating material (baffle and handle), metal(dactylogryposis) | ||||
Picture:
