Pego Electronics (Yi Chun) Company Limited
Pego Electronics-Focus on developing and promoting IEC lab testing equipments
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IP Testing Equipment Test Probe A for IP1X Testing According to IEC60529
Introduction of Test Probe A for IP1X Testing:
The test probe A is designed according to IEC61032 fig.1, and meet the requirements of IEC60529 regarding IP1X testing and IEC60065. This probe is intended to verify the protection of persons against access to hazardous parts. It is also used to verify the protection against access with the back of the hand.
Specification of Test Probe A for IP1X Testing:
| Diameter of test sphere: | 50mm | Diameter of baffle: | 50mm |
| Thickness of baffle: | 4mm | Diameter of handle: | 10mm |
| Length of handle: | 100mm | ||
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Material: insulating material (handle and baffle), metal (test sphere) |
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Picture of Test Probe A for IP1X Testing:
FAQ
1) Does the test probe A come with a calibration certificate?
Answer: Yes, it will come with a calibration certificate issued by third-lab authorized by ISO17025.
2) What's the material of sphere?
Answer: It's made of steel.
3) How can we order this item?
Answer: E-mail us, we'll send the quotation to you within 24 hours.