Pego Electronics (Yi Chun) Company Limited
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IEC61032 Test Finger Probe Test Probe A 50mm Sphere with Handle
Introduction:
Designed according to IEC61032 fig.1, and meet the requirements of IEC60529 regarding IP1X testing and IEC60065. This probe is intended to verify the protection of persons against access to hazardous parts. It is also used to verify the protection against access with the back of the hand.
Specification:
| Diameter of test sphere: | 50mm | Diameter of baffle: | 50mm |
| Thickness of baffle: | 4mm | Diameter of handle: | 10mm |
| Length of handle: | 100mm | ||
| Material: insulating material (handle and baffle), metal (test sphere) | |||
| Force applied: 50N thruster for optional | |||
Picture:
