Pego Electronics (Yi Chun) Company Limited
Pego Electronics-Focus on developing and promoting IEC lab testing equipments
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IEC60884-1 20N and 1N Test Gauges for Checking No-Accessibility of Live Parts Through Shutters
1. Introduction
The probes are designed according to IEC60884-1 figure 9 and figure 10. 20N test probe is for checking non-accessibility live part through shutters, 1N test probe is for checking non-accessibility live part through shutters and live parts of socket-outlets with increased protection.
2. Parameter
| 20N Push force | Rigid steel wire | Diameter: 3+0.03mm, length: 80±0.5mm |
| Tip of rigid steel wire | R0.2+0.05 | |
| 1N Push Force | Rigid steel wire | Diameter: 1+0.015mm, length: 80±0.5mm |
| Tip of rigid steel wire | R0.05 |
3. Diagram
