Pego Electronics (Yi Chun) Company Limited
Pego Electronics-Focus on developing and promoting IEC lab testing equipments
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Blunt Probe as Per IEC60950, IEC60065 and IEC62368-1 for Testing TNT Circuit
1. Introduction
The blunt probe is designed according to IEC60950 figure 2C, IEC60065 figure B1, IEC62151 figure 3, UL6500 figure B.1, IEC62368-1 figure V.3. It is applied to check if the exposed parts of TNT circuits of information technology equipment has adequate protection.
2. Specification
| Length of the probe | 80mm±0.2mm |
| Radius of probe | R6＋0.05mm |
| Diameter of probe | φ12＋0.05mm |
| Diameter of stop | φ50mm±0.2mm |
| Material | Insulation material (probe), nylon (handle) |
3. Figure
4. Shipment
The probe will be packed with a plastic box and the outer package is a carton. Normally, we will ship the goods by Fedex, DHL or UPS, and the goods can be reach at the customer end within 3-7 working days, the traking number will be sent to our customers after we ship out the goods.