Pego Electronics (Yi Chun) Company Limited
Pego Electronics-Focus on developing and promoting IEC lab testing equipments
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Standard Test Finger for Accessiblity Test
1. Introduction
Standard test finger also be called as jointed test finger and test probe B, it is applied to simulate the human finger to verify the accessbility to hazardous parts of electrical and electronic devices. This probe is widely refered by IEC60335-1, IEC62368-1, IEC60598-1 and other products standards.
Standard test finger is strictly designed according to IEC61032 figure 2, it consists by inslating handle and metal finger. During the test, 10N and 30N forces are requested to apply, so this probe is built-in 0-50N thruster. A wire is lead out to connect with electrical indicator to indicate the accessibility of hazardous live parts.
2. Specification
| Model | PG-TPB |
| Jointed point size 1 | 30±0.2 |
| Jointed point size 2 | 60±0.2 |
| Length of finger | 80±0.2 |
| Fingertip to baffle size | 180±0.2 |
| Fingertip taper fillet | S4±0.05 |
| Diameter of finger | Ф12 0 -0.05 |
| Diameter of baffle | Ф75±0.2 |
| Thickness of baffle | 5±0.5 |
| A-A section diameter | Ф50 |
| A-A section width | Ф20±0.2 |
| Thruster | 10N optional |
| Standard | IEC61032 |
