Pego Electronics (Yi Chun) Company Limited
Pego Electronics-Focus on developing and promoting IEC lab testing equipments
Add to Cart
Standard Test Finger
1.Introduction
The standard test finger is designed to meet the test requirements of IEC60601-1 clause 5.9.2.1 & figure 6, IEC61032figugre 2, IEC62368-1 annex V.1.2 & figure V.2, IEC60335-1 clause 8.1, IEC60529, IEC60598-1 clause 8.2.5, IEC60884-1 clauses 10.1&16.2.2, AS/NZS3112 clause 3.8.1, for checking the accessibility to hazardous parts of electronic devices.
The standard test finger consists by dactylogryposis and handle. The dactylogrypossis has two active joints that can bend in 90 degrees. The finger part is made of steel material, the handle is made of nylon, and has a terminals of M6 threaded hole to work with force gauge. Or the probe can built-in 50N thruster to apply appropriate force directly during the test. The test probe B is to simulate the person’s finger, to evaluate the protection of person’s finger from hazard parts (Live parts or mechanical parts) of enclosure. Standard test finger is the IP code probe for IP2X testing.
2. Specification
| Model | PG-TPB |
| Jointed point size 1 | 30±0.2 |
| Jointed point size 2 | 60±0.2 |
| Length of finger | 80±0.2 |
| Fingertip to baffle size | 180±0.2 |
| Fingertip taper fillet | S4±0.05 |
| Diameter of finger | Ф12 0 -0.05 |
| Diameter of baffle | Ф75±0.2 |
| Thickness of baffle | 5±0.5 |
| A-A section diameter | Ф50 |
| A-A section width | Ф20±0.2 |
| Thruster | 10N optional |
| Standard | IEC61032 |
