Pego Electronics (Yi Chun) Company Limited

Pego Electronics-Focus on developing and promoting IEC lab testing equipments

Manufacturer from China
Verified Supplier
8 Years
Home / Products / Test Finger Probe / Standard Test Finger Probe with 30±0.2 Jointed Point 80±0.2 Length and 180±0.2 Fingertip to Baffle for Accessibility Testing /

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Pego Electronics (Yi Chun) Company Limited
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City:yichun
Province/State:jiangxi
Country/Region:china
Contact Person:MsPenny Peng
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Standard Test Finger Probe with 30±0.2 Jointed Point 80±0.2 Length and 180±0.2 Fingertip to Baffle for Accessibility Testing

Standard Test Finger Probe with 30±0.2 Jointed Point 80±0.2 Length and 180±0.2 Fingertip to Baffle for Accessibility Testing
  • Standard Test Finger Probe with 30±0.2 Jointed Point 80±0.2 Length and 180±0.2 Fingertip to Baffle for Accessibility Testing
Products Detailed
Standard Test Finger for Accessiblity Test 1. Introduction Standard test finger also be called as jointed test finger and test probe B, it is applied ...
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